Dipl.-Chem. Gabriele Mirschel

Wissenschaftliche Mitarbeiterin / Instrumentelle Analytik und Prozesskontrolle / Chemische Abteilung

Leibniz-Institut für Oberflächenmodifizierung e. V.
Permoserstr. 15 / D-04318 / Leipzig /


Telefon: +49 (0)341 235 - 3147
Fax: +49 (0)341 235 - 2584



Liste der Publikationen >>

  1. G. Mirschel, O. Daikos, T. Scherzer, C. Steckert,
    Near-Infrared Chemical Imaging Used for In-line Analysis of Inside Adhesive Layers in Textile Laminates
    Anal. Chim. Acta 932 (2016) 69-79

  2. G. Mirschel, U. Helmstedt, T. Scherzer, U. Decker, L. Prager,
    Monitoring of the Degree of Condensation in Alkoxysiloxane Layers by NIR Reflection Spectroscopy
    Ind. Eng. Chem. Res. 53 (2014) 16813- 16819

  3. G. Mirschel, O. Daikos, K. Heymann, U. Decker, T. Scherzer, C. Sommerer, B. Genest, C. Steckert,
    In-line monitoring of printing processes in an offset printing press by NIR spectroscopy: Correlation between the conversion and the content of extractable acrylate in UV-cured printing inks
    Progr. Org. Coat. 77 (2014) 1682-1687

  4. G. Mirschel, O. Daikos, K. Heymann, T. Scherzer, B. Genest, C. Sommerer, C. Steckert,
    In-line monitoring of the conversion in UV-cured printed layers by NIR spectroscopy in an offset printing press
    Progr. Org. Coat. 77 (2014) 719-724

  5. O. Daikos, G. Mirschel, B. Genest, T. Scherzer,
    In-line Monitoring of the Thickness of Printed Layers by NIR Spectroscopy: Elimination of the Effect of the Varnish Formulation on the Prediction of the Coating Weight
    Ind. Eng. Chem. Res. 52 (2013) 17735-17743

  6. T. Scherzer, G. Mirschel, O. Daikos, K. Heymann, B. Genest, C. Sommerer, C. Steckert,
    In-line Monitoring of the Conversion in an Offset Printing Press
    Proc. RadTech Europe 2013, Basel, 15.-17.10. (2013)

  7. G. Mirschel, O. Savchuk, T. Scherzer, B. Genest,
    Process control of printing processes with in-line NIR spectroscopy and elimi nation of the influence of the substrate on the prediction of the coating weight
    Progr. Org. Coat. 76 (2013) 86-93

  8. G. Mirschel, O. Savchuk, T. Scherzer, B. Genest,
    The effect of different gloss levels on in-line monitoring of the thickness of printed layers by NIR spectroscopy
    Anal. Bioanal. Chem. 404 (2012) 573-583

  9. G. Mirschel, K. Heymann, O. Savchuk, T. Scherzer, B. Genest,
    In-line monitoring of the thickness of printed layers by NIR spectroscopy at a printing press
    Appl. Spectrosc. 66 (2012) 765-772

  10. T. Scherzer, G. Mirschel, O. Savchuk, K. Heymann, B. Genest,
    Control of UV Offset Printing Processes by In-line NIR Spectroscopy
    RadTech Europe 2011, Basel, 18.-20.10. (2011)

  11. G. Mirschel, K. Heymann, T. Scherzer,
    Simultaneous Measurement of Coating Thickness and Conversion of UV-Cured Acrylate Coatings by In-line NIR Spectroscopy
    Near Infrared Spectroscopy: Proceedings of the 14th International Conference, ed. by S. Saranwong, S. Kasemsumran, W. Thanapase, P. Williams, IM Publications, Chichester (2010) 1157-1159

  12. T. Scherzer, G. Mirschel, K. Heymann, L. Prager,
    In-line Monitoring of the Thickness of Silica and Silazane Layers in the Submicron Range by NIR Reflection Spectroscopy
    Near Infrared Spectroscopy: Proceedings of the 14th International Conference, ed. by S. Saranwong, S. Kasemsumran, W. Thanapase, P. Williams, IM Publications, Chichester (2010) 803-807

  13. G. Mirschel, K. Heymann, T. Scherzer,
    Simultaneous In-Line Monitoring of the Conversion and the Coating Thickness in UV-Cured Acrylate Coatings by Near-Infrared Reflection Spectroscopy
    Anal Chem 82 (2010) 8088-8094

  14. K. Heymann, G. Mirschel, T. Scherzer,
    Monitoring of the Thickness of Ultraviolet-Cured Pigmented Coatings and Printed Layers by Near-Infrared Spectroscopy
    Appl. Spectrosc. 64 (2010) 419-424

  15. T. Scherzer, G. Mirschel, K. Heymann, M. R. Buchmeiser,
    Continuous Monitoring of Process Parameters in UV Curing Processes
    RadTech Report 24(2) (2010) 40-48

  16. K. Heymann, G. Mirschel, T. Scherzer, M.R. Buchmeiser,
    In-line Determination of the Thickness of UV-Cured Coatings on Polymer Films by NIR Spectroscopy
    Vibr. Spectr. 51 (2009) 152-155

  17. T. Scherzer, G. Mirschel, K. Heymann, M.R. Buchmeiser,
    Continuous Monitoring of Process Parameters in UV Curing Processes
    Proc. RadTech Europe 2009 Conference, Nizza, 14.-15.10. (2009)

  18. G. Mirschel, K. Heymann, T. Scherzer, M. R. Buchmeiser,
    Effect of changes of the coating thickness on the in-line monitoring of the conversion of photopolymerized acrylate coatings by near-infrared reflection spectroscopy
    Polymer 50 (2009) 1895-1900

  19. T. Scherzer, G. Mirschel, K. Heymann, L. Prager, M. R. Buchmeiser,
    Determination of the Thickness of Silazane-Based SiOx Coatings in the Submicrometer Range by Near-Infrared Reflection Spectroscopy
    Appl. Spectrosc. 63 (2009) 239-245

  20. T. Scherzer, G. Mirschel, K. Heymann,
    In-line Monitoring of Coating Processes by NIR Reflection Spectroscopy
    Spectroscopy Europe 20 (6) (2008) 6-8

  21. T. Scherzer, K. Heymann, G. Mirschel, M. R. Buchmeiser,
    Process Control in Ultraviolet Curing with In-line Near Infrared Reflection Spectroscopy
    J. Near Infrared Spectrosc. 16 (2008) 165-171

  22. M. Braeckevelt, G. Mirschel, A. Wiesner, M. Rueckert, N. Reiche, C. Vogt, A. Schulz, H. Paschke, P. Kuschk, M. Kästner,
    Treatment of chlorobenzene-contaminated groundwater in a pilot-scale constructed wetland
    Ecological Engineering 33 (2008) 45-53

  23. M. Braeckevelt, H. Rokadia, G. Mirschel, S. Weber, G. Imfeld, N.Stelzer, P. Kuschk, M. Kästner, H. H. Richnow,
    Biodegradation of chlorobenzene in constructed wetland treating contaminated groundwater
    Water Science & Technology 56 (2007) 57-62

  24. H.-F. Listewnik, K.-D. Wendlandt, M. Jechorek, G. Mirschel,
    Process Design for the Microbial Synthesis of Poly-ß-hydroxybutyrate (PHB) from Natural Gas
    Eng. Life Sci. 7 (2007) 278-282


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