Figure / Topography

The analysis of topography and figure as well as the detection of surface defect structures are essential in the development of technological fabrication processes, but just as in basic research. Objects of investigation are optical device surfaces (lenses, mirrors) and thin films (metallizations, dielectric coatings, polymer films).

Analytical methods: interferometry (stitching, white light), AFM, confocal microscopy, dynamic light scattering, optical/tactile profilometry