Optical Properties

Vibrational spectroscopic methods can be used for versatile applications in analytics (e.g. structure determination, reaction monitoring, process control). Ellipsometry allows the determination of thin film thicknesses as well as the characterization of surface properties (e.g. dielectric properties, refractive indices). The combination with imaging techniques provides information about the spatial distribution of the parameter of interest.

Analytical methods: FT-IR, (FT-)Raman, UV/VIS/NIR, Ellipsometry, Fluorescence