Photons, electrons and particles in interaction with surfaces and interfaces

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Time-resolved Photoelectron Emission Microscopy

Schematic drawing of time-resolved PEEM setup using a femtosecond oscillator as laser source.

Photoelectron Emission Microscopy (PEEM) is the state of the art nanoscale imaging tool for studying the sample morphology. Our setup allows for a spatial resolution in the range of 40 − 60 nm depending on the sample roughness. Current work is mainly focusing on the study of the morphology of organic semiconducting films for electronic and optoelectronic applications. Since the morphology strongly influences the electronic properties, the precise knowledge of it in such organic semiconducting films is of great importance in order to correlate the nanoscale morphology with the electronic properties of the samples. Furthermore, since our PEEM is combined with a with femtosecond laser (Time-resolved PEEM), our experimental setup allows for a correlation of structural and dynamic properties. This particular combination of experiments yields to a direct relationship between the nanomorphology of a sample and the dynamics of the photoexcited states, which is nearly impossible to achieve with other techniques.


  • Laser PEEM

Selected Publications

  • A. Neff, F. Niefind, B. Abel, S.C.B. Mannsfeld, K.R. Siefermann
    Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

    Adv. Mater. 29 (2017) 1701012
    doi: 10.1002/adma.201701012