8th Saxon Preparators Meeting at the IOM

Interior view of an ion fine beam facility (FIB: Focused Ion Beam): The figure shows a high-resolution electron microscope with a Ga ion beam column and additional GIS (gas injection system) and a Kleindiek manipulator. (Photo: A. Mill)

On Tuesday, 12.10.2021, the 8th Saxon Preparators' Meeting took place at the IOM. The event brought together 40 interested people from 17 different institutions, including research institutes, universities and companies. This year's exchange of experiences focused on new challenges, progress and problems in TEM specimen preparation as well as the different procedures in TEM preparation technology. Topics such as preparation for in situ TEM, various applied preparation methods for powder and stainless steel samples, metal organic perovskite compounds as well as for transmission Kikuchi diffraction were covered in technical presentations and intensively discussed in direct talks. Possibilities of microscopic material sample preparation by laser as well as new developments on plasma FIB and their applications were also presented. The participating stakeholders used the meeting to exchange information about their respective activities and also had the opportunity to gain insights into the TEM preparation work at the IOM during a laboratory tour.