Last week, the 32 partners of the EU-funded joint project ‘10 Ångstrom CMOS Exploration’ met for their official review meeting at the Research and Innovation Centre for Nanoelectronics and Digital Technologies imec in Leuven (Belgium). The aim was to present the current status of the project to the EU reviewers and to discuss the next steps together.

Representing the IOM at the meeting were group leader Dr Frank Frost for the area of ‘Ion Beam Assisted Patterning and Smoothing’ and research assistant Peter Birtel. They presented the IOM's progress in the field of ion beam-assisted etching technology. The reviewers were very impressed overall and praised the outstanding scientific achievements of all the partners in the consortium.

A particular highlight was the guided tour of imec, one of the world's leading research centres in the field of nanoelectronics. The participants were given exclusive insights into the state-of-the-art production facilities and current research work.

‘It is impressive to see how consistently our European partners are advancing the field of microelectronics. At the same time, it is a valuable and exciting experience to be part of this strong and innovative network,’ summarised the IOM colleagues.

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